SN74ABTH18646A 具有 18 位通用总线收发器的扫描测试设备
The 'ABTH18646A and 'ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed transmission of data directly from the input bus or from the internal registers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells
|
SN74ABTH18646A |
| Voltage Nodes(V) |
5 |
| Vcc range(V) |
4.5 to 5.5 |
| Input Level |
TTL |
| Logic |
True |
| No. of Outputs |
18 |
| Output Drive(mA) |
-32/64 |
| tpd max(ns) |
5.4 |
| Output Level |
TTL |
| Static Current |
13.1 |
| Rating |
Catalog |
| Technology Family |
ABT |
SN74ABTH18646A 特性
- Members of the Texas Instruments SCOPETM Family of Testability Products
- Members of the Texas Instruments WidebusTM Family
- Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
- Include D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data
- Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors
- B-Port Outputs of 'ABTH182646A Devices Have Equivalent 25-
Series Resistors, So No External Resistors Are Required
- State-of-the-Art EPIC-IIBTM BiCMOS Design
- One Boundary-Scan Cell Per I/O Architecture Improves Scan Efficiency
- SCOPETM Instruction Set
- IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
- Parallel-Signature Analysis at Inputs
- Pseudo-Random Pattern Generation From Outputs
- Sample Inputs/Toggle Outputs
- Binary Count From Outputs
- Device Identification
- Even-Parity Opcodes
- Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat (HV) Packages Using 25-mil Center-to-Center Spacings
SN74ABTH18646A 芯片订购指南
| 器件 |
状态 |
温度 |
价格（美元） |
封装 | 引脚 |
封装数量 | 封装载体 |
丝印标记 |
| SN74ABTH18646APMG4 |
ACTIVE |
-40 to 85 |
16.70 | 1ku |
LQFP (PM) | 64 |
160 | JEDEC TRAY (10+1) |
|
| SN74ABTH18646APM |
ACTIVE |
-40 to 85 |
16.70 | 1ku |
LQFP (PM) | 64 |
160 | JEDEC TRAY (10+1) |
|
SN74ABTH18646A 质量与无铅数据
| 器件 |
环保计划* |
铅/焊球涂层 |
MSL 等级/回流焊峰 |
环保信息与无铅 (Pb-free) |
DPPM / MTBF / FIT 率 |
| SN74ABTH18646APMG4 |
Green (RoHS & no Sb/Br) |
CU NIPDAU |
Level-3-260C-168 HR |
SN74ABTH18646APMG4 |
SN74ABTH18646APMG4 |
| SN74ABTH18646APM |
Green (RoHS & no Sb/Br) |
CU NIPDAU |
Level-3-260C-168 HR |
SN74ABTH18646APM |
SN74ABTH18646APM |
SN74ABTH18646A 应用技术支持与电子电路设计开发资源下载
- SN74ABTH18646A 数据资料 dataSheet 下载.PDF
- TI 德州仪器特殊逻辑产品选型与价格 . xls
- Shelf-Life Evaluation of Lead-Free Component Finishes (PDF 1305 KB)
- Understanding and Interpreting Standard-Logic Data Sheets (PDF 857 KB)
- TI IBIS File Creation, Validation, and Distribution Processes (PDF 380 KB)
- Implications of Slow or Floating CMOS Inputs (PDF 101 KB)
- CMOS Power Consumption and CPD Calculation (PDF 89 KB)
- Designing With Logic (PDF 186 KB)
- Live Insertion (PDF 150 KB)
- Input and Output Characteristics of Digital Integrated Circuits (PDF 1708 KB)
- Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc (PDF 43 KB)
- HiRel Unitrode Power Management Brochure (PDF 206 KB)
- LOGIC Pocket Data Book (PDF 6001 KB)
- HiRel Unitrode Power Management Brochure (PDF 206 KB)
- Logic Cross-Reference (PDF 2938 KB)