SN74ACT8997 具有 4 位识别总线扫描控制的 TAP 合并器的扫描路径连接器
The 'ACT8997 are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of components facilitates testing of complex circuit-board assemblies.
The 'ACT8997 enhance the scan capability of TI's SCOPETM family by allowing augmentation of a system's primary scan path with secondary scan paths (SSPs), which can be individually selected by the 'ACT8997 for inclusion in the primary scan path. These devices also provide buffering of test signals to reduce the need for external logic.
By loading the proper values into the instruction register and data registers, the user can select up to four SSPs to be included in a primary scan path. Any combination of the SSPs can be selected at a time
| SN74ACT8997 | |
| Voltage Nodes(V) | 5 |
| Vcc range(V) | 4.5 to 5.5 |
| Input Level | TTL |
| Output Level | CMOS |
| Rating | Catalog |
| Technology Family | JTAG |
SN74ACT8997 特性
- Members of the Texas Instruments SCOPETM Family of Testability Products
- Compatible With the IEEE Standard 1149.1-1990 (JTAG) Serial Test Bus
- Allow Partitioning of System Scan Paths
- Can Be Cascaded Horizontally or Vertically
- Select Up to Four Secondary Scan Paths to Be Included in a Primary Scan Path
- Include 8-Bit Programmable Binary Counter to Count or Initiate Interrupt Signals
- Include 4-Bit Identification Bus for Scan-Path Identification
- Inputs Are TTL Compatible
- EPICTM (Enhanced-Performance Implanted CMOS) 1-
m Process
- Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs
SN74ACT8997 芯片订购指南
| 器件 | 状态 | 温度 | 价格（美元） | 封装 | 引脚 | 封装数量 | 封装载体 | 丝印标记 |
| SN74ACT8997DW | ACTIVE | -40 to 85 | 7.15 | 1ku | SOIC (DW) | 28 | 25 | TUBE | |
| SN74ACT8997DWR | ACTIVE | -40 to 85 | 7.15 | 1ku | SOIC (DW) | 28 | 2000 | LARGE T&R |
SN74ACT8997 质量与无铅数据
| 器件 | 环保计划* | 铅/焊球涂层 | MSL 等级/回流焊峰 | 环保信息与无铅 (Pb-free) | DPPM / MTBF / FIT 率 |
| SN74ACT8997DW | Green (RoHS & no Sb/Br) | CU NIPDAU | Level-1-260C-UNLIM | SN74ACT8997DW | SN74ACT8997DW |
| SN74ACT8997DWR | Green (RoHS & no Sb/Br) | CU NIPDAU | Level-1-260C-UNLIM | SN74ACT8997DWR | SN74ACT8997DWR |
SN74ACT8997 应用技术支持与电子电路设计开发资源下载
- SN74ACT8997 数据资料 dataSheet 下载.PDF
- TI 德州仪器特殊逻辑产品选型与价格 . xls
- Shelf-Life Evaluation of Lead-Free Component Finishes (PDF 1305 KB)
- Understanding and Interpreting Standard-Logic Data Sheets (PDF 857 KB)
- TI IBIS File Creation, Validation, and Distribution Processes (PDF 380 KB)
- Implications of Slow or Floating CMOS Inputs (PDF 101 KB)
- CMOS Power Consumption and CPD Calculation (PDF 89 KB)
- Designing With Logic (PDF 186 KB)
- Live Insertion (PDF 150 KB)
- Input and Output Characteristics of Digital Integrated Circuits (PDF 1708 KB)
- Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc (PDF 43 KB)
- HiRel Unitrode Power Management Brochure (PDF 206 KB)
- LOGIC Pocket Data Book (PDF 6001 KB)
- HiRel Unitrode Power Management Brochure (PDF 206 KB)
- Logic Cross-Reference (PDF 2938 KB)