SN74ABT18646 具有 18 位总线收发器和寄存器的扫描测试设备

This scan test device with a 18-bit bus transceiver and register is a member of the Texas Instruments SCOPETM testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the four-wire test access port (TAP) interface.

In the normal mode, this device is an 18-bit bus transceiver and register that allows for multiplexed transmission of data directly from the input bus or from the internal registers. It can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary test cells

	SN74ABT18646
Voltage Nodes(V)	5
Vcc range(V)	4.5 to 5.5
Input Level	TTL
Logic	True
No. of Outputs	18
Output Drive(mA)	-32/64
tpd max(ns)	6.1
Output Level	TTL
Static Current	18.5
Rating	Catalog
Technology Family	ABT

SN74ABT18646 特性

• Member of the Texas Instruments WidebusTM Family
• Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
• Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data
• Two Boundary-Scan Cells Per I/O for Greater Flexibility
• SCOPETM Instruction Set
  • IEEE Std 1149.1-1990 Required Instructions, Optional INTEST, and P1149.1A CLAMP and HIGHZ
  • Parallel Signature Analysis at Inputs With Masking Option
  • Pseudorandom Pattern Generation From Outputs
  • Sample Inputs/Toggle Outputs
  • Binary Count From Outputs
  • Device Identification
  • Even-Parity Opcodes

SN74ABT18646 芯片订购指南

器件	状态	温度	价格（美元）	封装 | 引脚	封装数量 | 封装载体	丝印标记
SN74ABT18646PM	ACTIVE	-40 to 85	14.40 | 1ku	LQFP (PM) | 64	160 | JEDEC TRAY (10+1)
SN74ABT18646PMG4	ACTIVE	-40 to 85	14.40 | 1ku	LQFP (PM) | 64	160 | JEDEC TRAY (10+1)

SN74ABT18646 质量与无铅数据

器件	环保计划*	铅/焊球涂层	MSL 等级/回流焊峰	环保信息与无铅 (Pb-free)	DPPM / MTBF / FIT 率
SN74ABT18646PM	Green (RoHS & no Sb/Br)	CU NIPDAU	Level-3-260C-168 HR	SN74ABT18646PM	SN74ABT18646PM
SN74ABT18646PMG4	Green (RoHS & no Sb/Br)	CU NIPDAU	Level-3-260C-168 HR	SN74ABT18646PMG4	SN74ABT18646PMG4

SN74ABT18646 应用技术支持与电子电路设计开发资源下载

1. SN74ABT18646 数据资料 dataSheet 下载.PDF
2. TI 德州仪器特殊逻辑产品选型与价格 . xls
3. Shelf-Life Evaluation of Lead-Free Component Finishes (PDF 1305 KB)
4. Understanding and Interpreting Standard-Logic Data Sheets (PDF 857 KB)
5. TI IBIS File Creation, Validation, and Distribution Processes (PDF 380 KB)
6. Implications of Slow or Floating CMOS Inputs (PDF 101 KB)
7. CMOS Power Consumption and CPD Calculation (PDF 89 KB)
8. Designing With Logic (PDF 186 KB)
9. Live Insertion (PDF 150 KB)
10. Input and Output Characteristics of Digital Integrated Circuits (PDF 1708 KB)
11. Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc (PDF 43 KB)
12. HiRel Unitrode Power Management Brochure (PDF 206 KB)
13. LOGIC Pocket Data Book (PDF 6001 KB)
14. HiRel Unitrode Power Management Brochure (PDF 206 KB)
15. Logic Cross-Reference (PDF 2938 KB)