SN74ABT18640 具有 18 位反向总线收发器的扫描测试设备

The 'ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are 18-bit inverting bus transceivers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells.

	SN74ABT18640
Voltage Nodes(V)	5
Vcc range(V)	4.5 to 5.5
Input Level	TTL
Logic	Inv
No. of Outputs	18
Output Drive(mA)	-32/64
tpd max(ns)	5.4
Output Level	TTL
Static Current	21.5
Rating	Catalog
Technology Family	ABT

SN74ABT18640 特性

• Members of the Texas Instruments SCOPETM Family of Testability Products
• Members of the Texas Instruments WidebusTM Family
• Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
• SCOPETM Instruction Set
  • IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
  • Parallel-Signature Analysis at Inputs
  • Pseudo-Random Pattern Generation From Outputs
  • Sample Inputs/Toggle Outputs
  • Binary Count From Outputs
  • Device Identification
  • Even-Parity Opcodes
• State-of-the-Art EPIC-IIBTM BiCMOS Design Significantly Reduces Power Dissipation
• Packaged in Plastic Shrink Small-Outline (DL) and Thin Shrink Small-Outline (DGG) Packages and 380-mil Fine-Pitch Ceramic Flat (WD) Packages

SN74ABT18640 芯片订购指南

器件	状态	温度	价格（美元）	封装 | 引脚	封装数量 | 封装载体	丝印标记
74ABT18640DGGRE4	ACTIVE	-40 to 85	13.42 | 1ku	TSSOP (DGG) | 56	2000 | LARGE T&R
74ABT18640DGGRG4	ACTIVE	-40 to 85	13.42 | 1ku	TSSOP (DGG) | 56	2000 | LARGE T&R
SN74ABT18640DGGR	ACTIVE	-40 to 85	13.42 | 1ku	TSSOP (DGG) | 56	2000 | LARGE T&R
SN74ABT18640DL	ACTIVE	-40 to 85	13.42 | 1ku	SSOP (DL) | 56	20 | TUBE
SN74ABT18640DLG4	ACTIVE	-40 to 85	13.42 | 1ku	SSOP (DL) | 56	20 | TUBE

SN74ABT18640 质量与无铅数据

器件	环保计划*	铅/焊球涂层	MSL 等级/回流焊峰	环保信息与无铅 (Pb-free)	DPPM / MTBF / FIT 率
74ABT18640DGGRE4	Green (RoHS & no Sb/Br)	CU NIPDAU	Level-1-260C-UNLIM	74ABT18640DGGRE4	74ABT18640DGGRE4
74ABT18640DGGRG4	Green (RoHS & no Sb/Br)	CU NIPDAU	Level-1-260C-UNLIM	74ABT18640DGGRG4	74ABT18640DGGRG4
SN74ABT18640DGGR	Green (RoHS & no Sb/Br)	CU NIPDAU	Level-1-260C-UNLIM	SN74ABT18640DGGR	SN74ABT18640DGGR
SN74ABT18640DL	Green (RoHS & no Sb/Br)	CU NIPDAU	Level-1-260C-UNLIM	SN74ABT18640DL	SN74ABT18640DL
SN74ABT18640DLG4	Green (RoHS & no Sb/Br)	CU NIPDAU	Level-1-260C-UNLIM	SN74ABT18640DLG4	SN74ABT18640DLG4

SN74ABT18640 应用技术支持与电子电路设计开发资源下载

1. SN74ABT18640 数据资料 dataSheet 下载.PDF
2. TI 德州仪器特殊逻辑产品选型与价格 . xls
3. Shelf-Life Evaluation of Lead-Free Component Finishes (PDF 1305 KB)
4. Understanding and Interpreting Standard-Logic Data Sheets (PDF 857 KB)
5. TI IBIS File Creation, Validation, and Distribution Processes (PDF 380 KB)
6. Implications of Slow or Floating CMOS Inputs (PDF 101 KB)
7. CMOS Power Consumption and CPD Calculation (PDF 89 KB)
8. Designing With Logic (PDF 186 KB)
9. Live Insertion (PDF 150 KB)
10. Input and Output Characteristics of Digital Integrated Circuits (PDF 1708 KB)
11. Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc (PDF 43 KB)
12. HiRel Unitrode Power Management Brochure (PDF 206 KB)
13. LOGIC Pocket Data Book (PDF 6001 KB)
14. HiRel Unitrode Power Management Brochure (PDF 206 KB)
15. Logic Cross-Reference (PDF 2938 KB)