The 'ACT8997 are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of components facilitates testing of complex circuit-board assemblies.
The 'ACT8997 enhance the scan capability of TI's SCOPETM family by allowing augmentation of a system's primary scan path with secondary scan paths (SSPs), which can be individually selected by the 'ACT8997 for inclusion in the primary scan path. These devices also provide buffering of test signals to reduce the need for external logic.
By loading the proper values into the instruction register and data registers, the user can select up to four SSPs to be included in a primary scan path. Any combination of the SSPs can be selected at a time
SN54ACT8997 | |
Voltage Nodes(V) | 5 |
Vcc range(V) | 4.5 to 5.5 |
Input Level | TTL |
Output Level | CMOS |
Rating | Military |
Technology Family | JTAG |
器件 | 状态 | 温度 | 价格(美元) | 封装 | 引脚 | 封装数量 | 封装载体 | 丝印标记 |
SNJ54ACT8997FK | ACTIVE | -55 to 125 | 27.32 | 1ku | LCCC (FK) | 28 | 1 | TUBE | |
SNJ54ACT8997JT | ACTIVE | -55 to 125 | 20.50 | 1ku | CDIP (JT) | 24 | 1 | TUBE | |
SNJ54ACT8997W | ACTIVE | -55 to 125 | 35.52 | 1ku | CFP (W) | 24 | 1 | TUBE |
器件 | 环保计划* | 铅/焊球涂层 | MSL 等级/回流焊峰 | 环保信息与无铅 (Pb-free) | DPPM / MTBF / FIT 率 |
SNJ54ACT8997FK | TBD | POST-PLATE | N/A for Pkg Type | SNJ54ACT8997FK | SNJ54ACT8997FK |
SNJ54ACT8997JT | TBD | A42 | N/A for Pkg Type | SNJ54ACT8997JT | SNJ54ACT8997JT |
SNJ54ACT8997W | TBD | A42 | N/A for Pkg Type | SNJ54ACT8997W | SNJ54ACT8997W |