EVAL-ADM1176EBZ: Hot Swap Controller and I^2C(R) Power Monitor
The ADM1176 is an integrated hot swap controller that offers digital current and voltage monitoring via an on-chip, 12-bit analog-to-digital converter (ADC), communicated through an I^2C interface.
An internal current sense amplifier senses voltage across the sense resistor in the power path via the VCC pin and the SENSE pin.
The ADM1176 limits the current through this resistor by control-ling the gate voltage of an external N-channel FET in the power path, via the GATE pin. The sense voltage (and, therefore, the inrush current) is kept below a preset maximum.
The ADM1176 protects the external FET by limiting the time that it spends with maximum current running through it. This current limit period is set by the choice of capacitor attached to the TIMER pin. Additionally, the device provides protection from overcurrent events that may occur once the hot swap event is complete. In the case of a short-circuit event, the current in the sense resistor exceeds an overcurrent trip threshold, and the FET is switched off immediately by pulling down the GATE pin.
A 12-bit ADC can measure the current seen in the sense resistor, as well as the supply voltage on the VCC pin. An industry-standard I^2C interface allows a controller to read current and voltage data from the ADC. Measurements can be initiated by an I^2C command. Alternatively, the ADC can run continuously, and the user can read the latest conversion data whenever it is required. Up to 16 unique I^2C addresses can be created, depending on the way the A0 and A1 pins are connected.
The ADM1176 is packaged in a 10-lead MSOP.
产品应用领域 Applications
- Power monitoring/power budgeting
- Central office equipment
- Telecommunication and data communication equipment
- PCs/servers
EVAL-ADM1176EBZ 特点
- Allows safe board insertion and removal from a live backplane
- Controls supply voltages from 3.15 V to 16.5 V
- Precision current sense amplifier
- Precision voltage input
- 12-bit ADC for current and voltage readback
- Charge pumped gate drive for external N-channel FET
- I^2C fast mode-compliant interface (400 kHz maximum)
- Adjustable analog current limit with circuit breaker
- ±3% accurate hot swap current limit level
- Fast response limits peak fault current
- Automatic retry or latch-off on current fault
- Programmable hot swap timing via TIMER pin
- Active-high ON pin
- 2 address pins allow 16 devices on the same bus
- 10-lead MSOP
EVAL-ADM1176EBZ 功能框图
| 产品型号 | 产品状态 | 封装 | 引脚 | 温度范围 |
|---|---|---|---|---|
| ADM1176-1ARMZ-R7 | 量产 | 10 ld MSOP | 10 | 工业 |
| ADM1176-2ARMZ-R7 | 量产 | 10 ld MSOP | 10 | 工业 |
| EVAL-ADM1176EBZ | 量产 | 评估板 | - | 待定 |
EVAL-ADM1176EBZ 应用技术支持与电子电路设计开发资源下载
- ADM1176 数据手册DataSheet 下载 . PDF
- ADI 模拟器件公司比较器产品选型指南 . PDF
- Analog Devices, Inc. 美国模拟器件公司产品订购手册 .PDF
- 热插拨及电源监控器广告( pdf, 306kb)
- 电源监控器与时序控制器. PDF